Zootos Software for Image Analysis System iX Series
Versatile and high precision Software for Image Analysis System for Analyzing Image and Advance Measurement with user friendly interface for easier task performed presented by MSP Metrology (M) Sdn Bhd from Zootos Korea
Features
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Analyze and measure the images in real-time.
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Capable of various inspection devices using camera.
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Supports various and quick functions to analyze high resolution images in real time.
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User-friendly interface to perform the task easier and faster.
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Supports various cameras and optical inspection device.
Basic/Live Measurement Tools
Live preview image on monitor to perform analysis without having to capture the image in-advance
Multi Focus
Provides extended focus capability to overcome limited depth of focus in high magnification microscopes.
Manual Tiling
Large size (Field of View) specimen can be captured separately and combined to form one complete image.
Auto Edge Detection
Automatically detected edges of various kind of shape of an object/sample to allow automatic measurement of the sample.
Advance Measurement Tool
Tool for additional measurement
Particle Analysis
- Support analysis tools automatically detecting and analyzing the objects in the image
- Measure number, area and perimeter, etc of detected objects
- Object detection in various color spaces such as RGB, CMYK, HSI, HSV, HLS, YUV, YIQ, YCbCr, LUV, Lab, etc.
- Supports various AOI tools, specifies upper and lower limit values of the analysis
- Automatic/manual classification function
Specifications
| Model | iL | iX | iXM | iXMR | iXMA | iXI | iXIR | iXIA | ||
|
FUNCTION |
Capture |
Camera Control | O | O | O | O | O | O | O | O |
| TWAIN, WDM | O | O | O | O | O | O | O | O | ||
| Multi Capture | O | O | O | O | O | O | O | |||
| Time Lapse | O | O | O | O | O | O | O | |||
|
Processing |
Basic Filter | O | O | O | O | O | O | O | O | |
| Extended Filter | O | O | O | O | O | O | O | |||
|
Image Synthesis |
Manual Tiling | O | O | O | O | O | O | O | O | |
| Manual Multi-Focus | O | O | O | O | O | O | O | O | ||
| Extended Tiling | O | O | O | O | O | O | O | |||
| Extended Multi-Focus | O | O | O | O | O | O | O | |||
| Auto Edge Detection | O | O | O | O | O | O | O | |||
| Extended AOI | O | O | O | O | O | O | O | |||
|
Measurement |
Basic Measurement | O | O | O | O | O | O | O | O | |
| Live Measurement | O | O | O | O | O | O | O | O | ||
| Extended Measurement Tools | O | O | O | O | O | O | O | |||
| Particle Analysis | O | O | O | O | O | O | O | |||
| Phase Analysis | O | O | O | O | O | O | ||||
| Grain | O | O | O | O | O | O | ||||
| Cast Iron | O | O | O | O | O | O | ||||
| Nonmetallic Inclusion | O | O | O | |||||||
|
AMS |
Stage Not Included | O | O | |||||||
|
Report |
Excel Reporting System | O | O | O | O | O | O | O | O | |
| Report Manager | O | O | O | O | ||||||
Optional
- Report Manager
- Grain analysis
- Cast iron analysis
- Phase analysis
- Non-metallic inclusion analysis
